(2X4) C(2X8) TO (4X2)/C(8X2) TRANSITION ON GAAS(001) SURFACES/

Citation
P. Moriarty et al., (2X4) C(2X8) TO (4X2)/C(8X2) TRANSITION ON GAAS(001) SURFACES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 943-947
Citations number
21
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
2
Year of publication
1996
Pages
943 - 947
Database
ISI
SICI code
1071-1023(1996)14:2<943:(CT(TO>2.0.ZU;2-E
Abstract
We present scanning tunneling microscopy data illustrating the evoluti on of the decapped GaAs(001) surface following annealing in stages fro m 450 to 540 degrees C. After annealing at 450 degrees C a (2x4) recon struction is formed by kinked rows of two As dimer unit cells. Followi ng annealing in the 475-500 degrees C range small isolated regions of (4x2) reconstruction are visible, with a considerable increase in diso rder of the remaining (2x4) reconstructed areas. Annealing at higher t emperatures causes the (4x2) structure to become increasingly dominant . We have noted significant differences in the surface morphology as a function of annealing time. Our images of the (4x2) surface are simil ar to those recently reported by other groups but we propose a new str uctural model. (C) 1996 American Vacuum Society.