P. Moriarty et al., (2X4) C(2X8) TO (4X2)/C(8X2) TRANSITION ON GAAS(001) SURFACES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 943-947
We present scanning tunneling microscopy data illustrating the evoluti
on of the decapped GaAs(001) surface following annealing in stages fro
m 450 to 540 degrees C. After annealing at 450 degrees C a (2x4) recon
struction is formed by kinked rows of two As dimer unit cells. Followi
ng annealing in the 475-500 degrees C range small isolated regions of
(4x2) reconstruction are visible, with a considerable increase in diso
rder of the remaining (2x4) reconstructed areas. Annealing at higher t
emperatures causes the (4x2) structure to become increasingly dominant
. We have noted significant differences in the surface morphology as a
function of annealing time. Our images of the (4x2) surface are simil
ar to those recently reported by other groups but we propose a new str
uctural model. (C) 1996 American Vacuum Society.