L. Andersohn et al., INTERACTION OF VINYLTRIMETHYLSILANE WITH THE SI(111)-(7X7) SURFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1032-1037
Vinyltrimethylsilane (vtms) serves as a ligand in the precursor molecu
le Cu-(I)(vtms)(hfac) used in copper chemical vapor deposition. Invest
igations of the interaction of vtms with the Si(111)-(7x7) surface uti
lizing scanning tunneling microscopy, Auger electron spectroscopy, and
thermal desorption spectroscopy (TDS) are reported. The adsorption is
found to be highly site sensitive with an initial sticking coefficien
t most probably in excess of 0.03. With the exception of hydrogen, TDS
spectra do not display vtms or any other desorbing species. Heating o
f the vtms covered surface to approximate to 530 degrees C leads to th
e formation of three-dimensional clusters which remain stable in shape
and size up to temperatures as high as 1100 degrees C. We believe the
observed clusters consist of carbon and/or SiC. In addition. the obse
rvation of (5x5) reconstructed areas between the clusters suggests the
deposition of silicon during the annealing process. This indicates th
at vtms undergoes thermal decomposition on a silicon surface. This is
in significant contrast to the observed behavior on metal and insulati
ng surfaces. Consequently we cannot expect contaminant-free interfaces
between the Si(111) substrate and copper films grown from the Cu-(I)(
vtms)(hfac) precursor. (C) 1996 American Vacuum Society.