IN-SITU SCANNING TUNNELING MICROSCOPE INVESTIGATION OF PASSIVATION AND STAINLESS-STEELS AND IRON

Authors
SCHREYER A ENG L BOHNI H
Citation
A. Schreyer et al., IN-SITU SCANNING TUNNELING MICROSCOPE INVESTIGATION OF PASSIVATION AND STAINLESS-STEELS AND IRON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1162-1166
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
14
Issue
2
Year of publication
1996
Pages
1162 - 1166
Database
ISI
SICI code
1071-1023(1996)14:2<1162:ISTMIO>2.0.ZU;2-L
Abstract
In situ scanning probe microscopy (SPM) is used to characterize passiv ation of steel alloys [DIN 1.4301 and 1.4529 (DIN is the German charac terization number, comparable to AISI numbers)] as well as pure iron i n 0.01 M sulfuric acid and boron buffer solution (pH 8.4), respectivel y It is shown, that using d(ln i)/ds spectroscopy semiconducting prope rties of the growing passive layer can be investigated. (C) 1996 Ameri can Vacuum Society.