A. Oral et al., SCANNING HALL PROBE MICROSCOPY OF SUPERCONDUCTORS AND MAGNETIC-MATERIALS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1202-1205
We describe results from a scanning Hall probe microscope operating in
a broad temperature range, 4-300 K. A submicron Hall probe manufactur
ed in a GaAs/AlGaAs two-dimensional electron gas is scanned over the s
ample to measure the surface magnetic fields using conventional scanni
ng tunneling microscopy positioning techniques, The magnetic field str
ucture of the sample together with the topography can be obtained simu
ltaneously, The technique is noninvasive with an extremely low self-fi
eld of < 10(-2) G and yields a quantitative measurement of the surface
magnetic field in contrast to magnetic force microscopy. in addition
the microscope has an outstanding magnetic field resolution (similar t
o 1.1 x 10(-3) G/Hz at 77 K) and high spatial resolution, similar to 0
.85 mu m, Images of individual vortices in a high-T-c Y1Ba2Cu3O7-gamma
thin film at low temperatures and magnetic domains in an Fe-garnet cr
ystal at room temperature are presented. (C) 1996 American Vacuum Soci
ety.