SCANNING FORCE AND FRICTION MICROSCOPY AT HIGHLY ORIENTED POLYCRYSTALLINE GRAPHITE AND CUP2(100) SURFACES IN ULTRAHIGH-VACUUM

We present a novel scanning force and friction microscope for applicat ions in ultrahigh vacuum (UHV) using the optical beam deflection metho d for detection. All optical components are positioned on the air side enabling a simple way of adjustment, the possibility of good decoupli ng of topography and lateral signal, and the absolute estimation of la teral force values, We demonstrate lateral atomic resolution on mica s urfaces freshly cleaved in UHV. As model systems, we investigate the c omplex CuP2(100) surface on the unit cell level which exhibits a wide range of atomic stick-slip phenomena. In addition, first results on th e friction behavior at step edges on highly oriented polycrystalline g raphite surfaces are presented. (C) 1996 American Vacuum Society.