ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS

Authors
OSHEA SJ WELLAND ME BRUNT TA RAMADAN AR RAYMENT T
Citation
Sj. Oshea et al., ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1383-1385
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
14
Issue
2
Year of publication
1996
Pages
1383 - 1385
Database
ISI
SICI code
1071-1023(1996)14:2<1383:AMSSFS>2.0.ZU;2-C
Abstract
Simple, sensitive, and fast sensors can be constructed from standard a tomic force microscopy cantilevers. For use in liquid environments, it is preferable to use changes in surface stress as the measurement bas is of the sensor. We have constructed such a sensor in an electrochemi cal cell so that simultaneous cyclic voltammograms and strain measurem ents can be made. This is demonstrated with examples of underpotential deposition of Pb on Au(lll) and electrocapillary effects in KCl. (C) 1996 American Vacuum Society.