2-DIMENSIONAL DESMEARING OF CENTROSYMMETRIC SMALL-ANGLE X-RAY-SCATTERING DIFFRACTION PATTERNS

Citation
V. Leflanchec et al., 2-DIMENSIONAL DESMEARING OF CENTROSYMMETRIC SMALL-ANGLE X-RAY-SCATTERING DIFFRACTION PATTERNS, Journal of applied crystallography, 29, 1996, pp. 110-117
Citations number
13
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
29
Year of publication
1996
Part
2
Pages
110 - 117
Database
ISI
SICI code
0021-8898(1996)29:<110:2DOCSX>2.0.ZU;2-K
Abstract
Owing to the high dynamic range and resolution of image plates, digiti zation of the direct-beam profile as well as of two-dimensional small- angle X-ray scattering patterns gives data with enough accuracy to all ow desmearing of two-dimensional patterns after corrections of geometr ical distortions. A radial conversion of the images is used to compres s the images and to isolate a small area of interest. The results obta ined by the Wiener filtering method and the iterative method of Van Ci ttert on simulated patterns are compared.