STUDY OF CLEAVED METAL-INP (N) CONTACTS

Authors
Citation
C. Barret et H. Maaref, STUDY OF CLEAVED METAL-INP (N) CONTACTS, Solid-state electronics, 36(6), 1993, pp. 879-884
Citations number
30
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
36
Issue
6
Year of publication
1993
Pages
879 - 884
Database
ISI
SICI code
0038-1101(1993)36:6<879:SOCM(C>2.0.ZU;2-B
Abstract
Au, Ag, Al and Pd-InP (n type) interfaces were obtained by UHV and air cleavage. The interfaces were characterized by electrical methods: I- V, C-V, SCS (Schottky Capacitance Spectroscopy). In spite of great var iations in the reactivities of the deposited metals and two kinds of i nterface preparation, the Schottky barrier heights (except air cleaved Au-InP) are quite similar. The study of interface states by SCS shows the presence of two characteristic states, regardless of which metal, localized near E(c)-0.25 eV and E(c)-0.37 eV. The latter may play a s ignificant role in the Fermi level pinning.