M. Grayson et al., NOVEL CLEAVED EDGE OVERGROWTH STRUCTURES FOR TUNNELING INTO ONE-DIMENSIONAL AND 2-DIMENSIONAL ELECTRON-SYSTEMS, Solid-state electronics, 40(1-8), 1996, pp. 233-236
We report the fabrication of novel electron in-plane tunneling systems
in GaAs/AlxGa1-xAs using the technique of cleaved edge overgrowth, an
d report results of tunneling measurements into both one- and two-dime
nsional (1D and 2D) systems. Our devices demonstrate tunneling through
an abrupt molecular beam epitaxially defined barrier where the shape
of the barrier potential is exactly known. We study three different in
-plane tunneling geometries, namely 2D-1D-2D, 2D-2D and 2D-3D, and rep
ort current vs voltage characteristics for all three geometries.