NOVEL CLEAVED EDGE OVERGROWTH STRUCTURES FOR TUNNELING INTO ONE-DIMENSIONAL AND 2-DIMENSIONAL ELECTRON-SYSTEMS

Citation
M. Grayson et al., NOVEL CLEAVED EDGE OVERGROWTH STRUCTURES FOR TUNNELING INTO ONE-DIMENSIONAL AND 2-DIMENSIONAL ELECTRON-SYSTEMS, Solid-state electronics, 40(1-8), 1996, pp. 233-236
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
40
Issue
1-8
Year of publication
1996
Pages
233 - 236
Database
ISI
SICI code
0038-1101(1996)40:1-8<233:NCEOSF>2.0.ZU;2-O
Abstract
We report the fabrication of novel electron in-plane tunneling systems in GaAs/AlxGa1-xAs using the technique of cleaved edge overgrowth, an d report results of tunneling measurements into both one- and two-dime nsional (1D and 2D) systems. Our devices demonstrate tunneling through an abrupt molecular beam epitaxially defined barrier where the shape of the barrier potential is exactly known. We study three different in -plane tunneling geometries, namely 2D-1D-2D, 2D-2D and 2D-3D, and rep ort current vs voltage characteristics for all three geometries.