M. Ramsteiner et al., PHOTOLUMINESCENCE ENHANCEMENT INDUCED BY NEAR-SURFACE SI DOPING WIRESIN GAAS, Solid-state electronics, 40(1-8), 1996, pp. 329-332
We investigated the influence of the wire-like Si dopant incorporation
on the photoluminescence (PL) properties of samples with a thin GaAs
cap layer. The near band gap PL has been found to be dominated by exci
ton recombination in the 10 nm cap layers. For samples grown on vicina
l GaAs(001) surfaces under conditions favourable for the wire-like Si
incorporation, a considerable enhancement of the exciton PL intensity
as well as of the PL decay time has been found.