OPTICAL INVESTIGATION OF IMPURITY BANDS IN A DELTA-DOPED N-LAYER

Citation
J. Schonhut et al., OPTICAL INVESTIGATION OF IMPURITY BANDS IN A DELTA-DOPED N-LAYER, Solid-state electronics, 40(1-8), 1996, pp. 701-705
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
40
Issue
1-8
Year of publication
1996
Pages
701 - 705
Database
ISI
SICI code
0038-1101(1996)40:1-8<701:OIOIBI>2.0.ZU;2-R
Abstract
The radiative recombination of donor-acceptor pairs in a weakly doped delta n-i-delta p-i semiconductor superlattice is detected in time res olved photoluminescence experiments. At short times t less than or equ al to 1 mu s, a narrow luminescence line of FWHM = 2.6 meV is measured , which can be related to the width of the filled donor impurity band, formed by mutual orbital overlap. For longer times, a Coulomb induced broadening of the spectra up to FWHM = 6.5 meV is observed, accompani ed by a strongly non-exponential decay of the integrated luminescence intensity. The time-dependence of both the spectral width and intensit y is in good agreement with a detailed Monte-Carlo simulation of the d ynamical processes.