IN-SITU FOURIER-TRANSFORM INFRARED-ATTENUATED TOTAL-REFLECTION SPECTROSCOPY MONITORING OF POLYANILINE SYNTHESIS MECHANISM ON THE P-TYPE SILICON ELECTRODE

Authors
FAN QB NG LM
Citation
Qb. Fan et Lm. Ng, IN-SITU FOURIER-TRANSFORM INFRARED-ATTENUATED TOTAL-REFLECTION SPECTROSCOPY MONITORING OF POLYANILINE SYNTHESIS MECHANISM ON THE P-TYPE SILICON ELECTRODE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1326-1329
Citations number
14
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
14
Issue
3
Year of publication
1996
Part
2
Pages
1326 - 1329
Database
ISI
SICI code
0734-2101(1996)14:3<1326:IFITS>2.0.ZU;2-L
Abstract
The polymerization of aniline on the p-Si electrode was investigated b y in situ Fourier transform infrared-attenuated total reflection spect roscopy. Results show that the N-H vibrational mode of aniline: in the 3490-3050 cm(-1) range, shifts to lower wave number when the applied electrode potential becomes more positive. There is no benzidine inter mediate in this polymerization process. The IR adsorption spectrum of the polyaniline spectrum obtained by the in situ method is similar to that obtained by ex situ IR transmission detection. The mechanism of p olyaniline synthesis on the p-Si electrode is discussed. (C) 1996 Amer ican Vacuum Society.