R. Mu et al., ELECTRONIC AND VIBRATIONAL-SPECTRA OF INP QUANTUM-DOT FORMED BY SEQUENTIAL ION-IMPLANTATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1482-1487
Citations number
32
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Sequential ion implantation of indium and phosphorus into silica combi
ned with controlled thermal annealing has proven to be a novel and eff
ective technique to fabricate InP quantum dots in dielectric hosts. Th
is technique has been applied to synthesize other III-V and II-VI quan
tum dots. Due to the unique bimodal distribution of the indium in a si
lica host and a stoichiometric mismatch between the indium and phospho
rus concentration profiles, it is believed that two different-sized In
P quantum dots were fabricated. More importantly, we have shown that t
he infrared reflectance technique is a very effective method to identi
fy the species in the dielectric host and is also a powerful tool to i
nvestigate surface phonon modes. (C) 1994 American Vacuum Society.