M. Sugiyama et al., X-RAY STANDING-WAVE STUDY OF THE S-PASSIVATED INP(001) SURFACE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1812-1814
Citations number
16
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The adsorption position and ordering degree of S atoms on a S-passivat
ed InP(001) surface were investigated by using soft-x-ray standing wav
es (XSWs) in the photoelectron collection mode. Soft-x-ray photoelectr
on spectroscopy for a (NH4)(2)S-x-treated and de-ionized water-rinsed
InP(001) surface revealed that a small amount of residual elemental S
atoms on the InP(001) surface was completely removed by postannealing
at 400 degrees C in a vacuum. XSW results for the annealed sample show
ed that most of the S atoms stayed at the bridge site on the In-termin
ated InP(001) surface, forming In-S-In bridge bonds. (C) 1996 American
Vacuum Society.