PLASMA-ETCHING WITH SELF-ASSEMBLED MONOLAYER MASKS FOR NANOSTRUCTURE FABRICATION

Citation
Mj. Lercel et al., PLASMA-ETCHING WITH SELF-ASSEMBLED MONOLAYER MASKS FOR NANOSTRUCTURE FABRICATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1844-1849
Citations number
22
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
14
Issue
3
Year of publication
1996
Part
2
Pages
1844 - 1849
Database
ISI
SICI code
0734-2101(1996)14:3<1844:PWSMMF>2.0.ZU;2-T
Abstract
Self-assembled monolayers of octadecylthiol on GaAs and octadecylsilox anes on titanium, aluminum, and silicon have been used as electron bea m resists for plasma etching into the substrates. An electron cyclotro n resonance source was used to excite a low-pressure, high-density pla sma with low ion energy to achieve high selectivity with the thin mask ing layers. Patterning of monolayers on GaAs usually produced a negati ve tone, but etching of the metal surfaces resulted in positive tone p atterning. The maximum etch depth into the GaAs was similar to 100 nm using the negative tone process. Lines have been etched into Ti with l inewidths down to similar to 20 nm. The negative tone process can be e xplained by the cross linking of the monolayer under high-dose electro n beam exposure; however, the positive tone process must rely on contr ast either from different etching characteristics of the oxides or dif ferent structural arrangements of the different SAMs. (C) 1996 America n Vacuum Society.