R. Telfeyan et al., A MULTILEVEL APPROACH TO THE CONTROL OF A CHEMICAL-MECHANICAL PLANARIZATION PROCESS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1907-1913
Citations number
26
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
A multilevel hierarchical control system has been designed and is bein
g applied to chemical-mechanical planarization (CMP) process control,
The current implementation of the control system incorporates closed-l
oop run-to-run (R2R) control and open-loop real-time monitoring, and c
an accommodate inter-cell control. The R2R control element is enabled
via a generic cell controller (GCC) implementation that provides flexi
ble automated control of the process and equipment, multiple control a
lgorithm branches and fuzzy logic decision capability among the branch
es, simulation capabilities, hardware and software independence, and e
xtensive GUI support for control and data analysis. The R2R element ut
ilizes a linear approximation multivariate control algorithm (branch)
that supports individual exponential weighted moving average (EWMA) mo
deling of advices (outputs), weighting of inputs, granularity, and inp
ut bounding. The real-time element of the control system utilizes a pa
rtial least squares (PLS) algorithm to identify real-time equipment in
put trace patterns and relate these patterns to alarming conditions. T
he entire control system is designed to provide multivariate control o
f CMP process removal rate and uniformity. As a result of extensive de
sign of experiments and testing, the R2R control level has been demons
trated to achieve good control of removal rate and fair control of uni
formity. The addition of the real-time element is expected to improve
process control and reduce R2R process noise, thus leading to a more e
ffective R2R control element. (C) 1996 American Vacuum Society.