3-DIMENSIONAL EQUIPMENT MODELING FOR CHEMICAL-VAPOR-DEPOSITION

Citation
C. Werner et al., 3-DIMENSIONAL EQUIPMENT MODELING FOR CHEMICAL-VAPOR-DEPOSITION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1147-1151
Citations number
17
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
14
Issue
3
Year of publication
1996
Part
1
Pages
1147 - 1151
Database
ISI
SICI code
0734-2101(1996)14:3<1147:3EMFC>2.0.ZU;2-7
Abstract
Three-dimensional (3D) numerical equipment modeling using the simulato r PHOENICS-CVD was used to investigate a low pressure chemical vapor d eposition process for boron and phosphorus doped silicon glass deposit ion from TEOS, PH3, O-2, and TEE gas sources. The simulation allows th e 3D visualization of gas flow, temperature, and chemical concentratio n profiles in the reactor, as well as the calculation of the depositio n rate as a function of position. Mixing of gases from different inlet s and deposition uniformity due to reactive gas depletion were studied as a function of pressure, gas flow velocity, and reactor geometry. C omparison with experimental deposition rate data shows that published chemical models can well describe the undoped deposition, while additi onal chemical reactions seem to become important when PH3 is introduce d in the reactor for phosphorus doped glass deposition. (C) 1996 Ameri can Vacuum Society.