C. Werner et al., 3-DIMENSIONAL EQUIPMENT MODELING FOR CHEMICAL-VAPOR-DEPOSITION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1147-1151
Citations number
17
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Three-dimensional (3D) numerical equipment modeling using the simulato
r PHOENICS-CVD was used to investigate a low pressure chemical vapor d
eposition process for boron and phosphorus doped silicon glass deposit
ion from TEOS, PH3, O-2, and TEE gas sources. The simulation allows th
e 3D visualization of gas flow, temperature, and chemical concentratio
n profiles in the reactor, as well as the calculation of the depositio
n rate as a function of position. Mixing of gases from different inlet
s and deposition uniformity due to reactive gas depletion were studied
as a function of pressure, gas flow velocity, and reactor geometry. C
omparison with experimental deposition rate data shows that published
chemical models can well describe the undoped deposition, while additi
onal chemical reactions seem to become important when PH3 is introduce
d in the reactor for phosphorus doped glass deposition. (C) 1996 Ameri
can Vacuum Society.