HIGH-PURITY GAAS AND ALGAAS GROWN USING TERTIARYBUTYLARSINE, TRIMETHYLALUMINUM, AND TRIMETHYLGALLIUM

Citation
Rm. Biefeld et al., HIGH-PURITY GAAS AND ALGAAS GROWN USING TERTIARYBUTYLARSINE, TRIMETHYLALUMINUM, AND TRIMETHYLGALLIUM, Journal of crystal growth, 163(3), 1996, pp. 212-219
Citations number
25
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
163
Issue
3
Year of publication
1996
Pages
212 - 219
Database
ISI
SICI code
0022-0248(1996)163:3<212:HGAAGU>2.0.ZU;2-X
Abstract
We have grown high purity AlGaAs by metalorganic chemical vapor deposi tion using tertiarybutylarsine (TEA), trimethylgallium, and trimethyla luminum. We have achieved p-type carrier concentrations less than 4 x 10(14) cm(-3) and a mobility of 1015 cm(2)/V . s at 77 K. Photolumines cence measurements at 4 K yielded bound exciton linewidths as narrow a s 4.3 meV, the narrowest reported linewidths for AlGaAs grown using TE A. Secondary ion mass spectrometry measurements found C, O, Si, and S concentrations below the instrument detection limits. A two level fact orial design was used to investigate the effects of temperature, V/III ratio, and group III partial pressure on the mobility, carrier concen tration, and growth rate. High V/III ratios at temperatures between 64 0-700 degrees C gave the highest quality material. Increasing the V/II I ratio caused a decrease in the growth rates of both GaAs and AlGaAs using either arsine or TEA. This dependence can be explained by a comp etitive adsorption model where excess group V species complete with gr oup III atoms for group III surface sites.