ELECTRICAL-PROPERTIES OF CUGATE2 THIN-FILMS

Citation
Ms. Reddy et al., ELECTRICAL-PROPERTIES OF CUGATE2 THIN-FILMS, Materials chemistry and physics, 44(3), 1996, pp. 281-283
Citations number
22
Categorie Soggetti
Material Science
ISSN journal
02540584
Volume
44
Issue
3
Year of publication
1996
Pages
281 - 283
Database
ISI
SICI code
0254-0584(1996)44:3<281:EOCT>2.0.ZU;2-J
Abstract
CuGaTe2 thin films were prepared by the flash evaporation technique. T he influence of substrate temperature (T-s) on the electrical characte ristics was studied. The films formed at T-s = 523-573 K were polycrys talline, single phase and nearly stoichiometric. The films of 0.7 mu m thickness showed an electrical resistivity of about 10(-2) Omega cm, a mobility of 55 cm(2) V-1 s(-1) with a carrier concentration of 1.5 x 10(19) cm(-3). The electrical resistivity was found to decrease with film thickness, whereas the mobility increased. The activation energie s were also determined in the temperature range 300-575 K.