Jch. Spence et al., ATOMIC SPECIES IDENTIFICATION IN SCANNING-TUNNELING-MICROSCOPY BY TIME-OF-FLIGHT SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1587-1590
We report the first chemical identification of a cluster of atoms from
identifiable sites on an extended crystal surface. The instrument use
d combines the functions of a scanning tunneling microscope (STM) with
a time-of-flight (TOF) atom probe. Atoms are transferred from regions
of interest identified in STM images to the tip, from which they are
ejected into a TOF spectrometer. Preliminary results are shown in whic
h a cluster of silicon atoms taken from the Si(111) 7 x 7 surface is i
dentified by TOF spectra. Applications of these ''atomic tweezers'' fo
r microanalysis are discussed. (C) 1996 American Vacuum Society.