SHALLOW RIPPLES WITH GIANT WAVELENGTHS OBSERVED BY ATOMIC-FORCE MICROSCOPY - REAL EFFECTS AND THE REPORT OF A NEW ARTIFACT

Citation
Zx. Dai et al., SHALLOW RIPPLES WITH GIANT WAVELENGTHS OBSERVED BY ATOMIC-FORCE MICROSCOPY - REAL EFFECTS AND THE REPORT OF A NEW ARTIFACT, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1591-1595
Citations number
16
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
3
Year of publication
1996
Pages
1591 - 1595
Database
ISI
SICI code
1071-1023(1996)14:3<1591:SRWGWO>2.0.ZU;2-0
Abstract
The (210) surface of ammonium perchlorate has been studied with an ato mic force microscope. Unexpected surface ripples with shallow amplitud es (typically less than 3 nm) and giant wavelengths (typically between 0.5 and 1.3 mu m) have been discovered. The dominant type shows a wav e vector along the [001] direction, and a second type forms a pattern in which two wave vectors make an angle of similar to 60 degrees with each other. The amplitude and wavelength of the ripples are clearly co rrelated. Their size depends on the local surface structure, but their direction is usually keyed to the main crystalline directions. Unfort unately we have also discovered a new artifact that can produce simila r images. We discuss the evidence we have gathered thus far to support the existence of the ripples in addition to that of the artifact. (C) 1996 American Vacuum Society.