Jr. Jessing et al., POROUS SILICON FIELD-EMISSION CATHODE DEVELOPMENT, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1899-1901
This article will address the development of a porous silicon cathode
technology which shows promise in solving the existing problems, speci
fically unstable, low current density, nonreproducible and high voltag
e emission, encountered by other cathode technologies. Monolithic two-
and three-terminal devices have been designed, manufactured, and char
acterized. All of these devices have resulted in stable, reproducible
operating characteristics that follow the Fowler-Nordheim model. Vacuu
m transport of the electrons and temperature independence (to 250 degr
ees C) of the current-voltage characteristics have been confirmed. App
reciable emission current has been observed with macroscopic fields on
the order of 10(4) V/cm, thus indicating a large submicroscopic field
enhancement due to the geometrical nature of the porous silicon. (C)
1996 American Vacuum Society.