T. Yang et al., MOLECULAR-BEAM EPITAXY GROWTH OF STRONTIUM THIOGALLATE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2263-2266
The molecular-beam epitaxy growth and characterization of cerium doped
strontium thiogallate (SrGa2S4:Ce) thin film phosphors are reported.
The layers were grown on GaAs, and glass/indium tin oxide/dielectric s
tack substrates for device fabrication. Ga2S3/Sr beam equivalent press
ure ratios of 20-100 and CeCl3/Sr flux (molecules cm(-2) s(-1)) ratios
of 1/20-1110 were investigated in this study. The substrate temperatu
re was varied between 530 and 575 degrees C. A typical SrGa2S4:Ce film
growth rate of 0.5 mu m/h was obtained with Sr, Ga2S3, and CeCl3 beam
equivalent pressures of 2.0 x 10(-7), 1.0 x 10(-5), and 3.5 x 10(-8)
Torr, respectively. Characterization of the layers' structural and opt
ical properties by x-ray diffraction, transmission electron microscopy
, energy dispersive x-ray spectroscopy, and photoluminescence spectros
copy is presented. (C) 1996 American Vacuum Society.