This work deals with the interaction of an evanescent standing wave wi
th nanometer size objects in scanning tunneling optical microscopy (ST
OM/PSTM). Exploiting both the structure of the fringe pattern perturbe
d by the object and the last simulation works, we discuss the reality
of the near field images, We show that interferometry seems to be a go
od tool for discriminating the true optical signal from artefacts whos
e origin is not always understood.