SIMULTANEOUS REFLECTION AND TRANSMISSION MODES NEAR-FIELD SCANNING OPTICAL MICROSCOPE

Authors
WEI PK WEI CC HSU JH FANN WS
Citation
Pk. Wei et al., SIMULTANEOUS REFLECTION AND TRANSMISSION MODES NEAR-FIELD SCANNING OPTICAL MICROSCOPE, Ultramicroscopy, 61(1-4), 1995, pp. 237-239
Citations number
7
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
61
Issue
1-4
Year of publication
1995
Pages
237 - 239
Database
ISI
SICI code
0304-3991(1995)61:1-4<237:SRATMN>2.0.ZU;2-H
Abstract
A near-field optical microscope operated simultaneously in reflection and transmission modes is demonstrated. A low noise, large area Si pho todetector was mounted directly between the PZT scanning stage and the sample for the transmission measurement. In reflection mode, either a PMT or two large area Si detectors were used for the signal collectio n. In addition, a simple method for measuring the actual vibrational a mplitude in the shear force microscope was also discussed.