Comprehensive data on the internal friction spectra of silica glass in
the temperature range 0-2000 K allowed us to identify three relaxatio
n processes, theta, beta, and alpha, each characterized by its own typ
e of Si-O bond mobility. The theta-relaxation, a cryo,genic process, i
s due to ultra-small-scale rotations of Si-O bonds across microbarrier
s at the bottom of the major potential well with an activation energy
of 5.1 kJ/mol. The beta-relaxation, a high-temperature process observe
d below the glass-transition temperature (T-g = 1445 K) and characteri
zed by the activation energy U-beta 294 kJ/mol, is associated with lar
ge-amplitude torsional oscillations of Si-O bonds across the major pot
ential barrier and with changes in the Si-O-Si bond angle. Thermodynam
ic analysis of the molecular mechanism for the alpha-relaxation in vit
reous silica provides further proof of the dual nature of this process
. In particular it is shown that, as opposed to that observed in polym
ers, the glass transition in vitreous silica is a small-scale process
involving oxygen atoms as kinetic units and is not associated with rot
ational molecular mobility.