FIZEAU REFLECTION FRINGES FORMED ON HIGH-ORDER PLANES OF LOCALIZATION

Citation
M. Medhat et al., FIZEAU REFLECTION FRINGES FORMED ON HIGH-ORDER PLANES OF LOCALIZATION, Optik, 104(2), 1996, pp. 43-49
Citations number
19
Categorie Soggetti
Optics
Journal title
OptikACNP
ISSN journal
00304026
Volume
104
Issue
2
Year of publication
1996
Pages
43 - 49
Database
ISI
SICI code
0030-4026(1996)104:2<43:FRFFOH>2.0.ZU;2-8
Abstract
The intensity distribution and characteristics of the multiple-beam re flected Fizeau fringes resulting from a metal coated wedge interferome ter are studied. These fringes are formed on planes of localization of high orders which are either integral or fractional and located on bo th sides of the interferometer. The optical phase properties of the me tallic coating of the interferometer components are taken into conside ration, specifically the value of an optical phase property, the F-val ue, whether being odd or even multiples of pi. With F equals even mult iples of pi, transmission-like Fringes are formed at reflection. These fringes are recorded on high order planes of localization for the fir st time. Experimental verification of the theoretical findings are giv en.