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Table of contents of journal: *Optik

Results: 1-25/551

Authors: AYUPOV BM
Citation: Bm. Ayupov, DETERMINATION OF OPTICAL-PROPERTIES VARIATION OF SILICON AND GLASS SURFACES AFTER MECHANICAL AND PLASMA TREATMENTS BY MONOCHROMATIC ELLIPSOMETRY, Optik (Stuttgart), 109(4), 1998, pp. 145-149

Authors: SINGH UK KHASTGIR P SINGH ON
Citation: Uk. Singh et al., MODAL-ANALYSIS OF ANNULAR OPTICAL WAVE-GUIDES BOUNDED BY NONCOAXIAL DIELECTRIC CYLINDRICAL BOUNDARIES BY GOELLS POINT MATCHING METHOD, Optik (Stuttgart), 109(4), 1998, pp. 150-154

Authors: KOWALIK W KASPRZAK H JANKOWSKAKUCHTA E
Citation: W. Kowalik et al., ANALYSIS OF IN-VIVO INTERFEROMETRIC MEASUREMENT OF THE CORNEAL TOPOGRAPHY, Optik (Stuttgart), 109(4), 1998, pp. 155-162

Authors: SHARMA A KHASTGIR P SINGH ON
Citation: A. Sharma et al., MODAL DISPERSION-CURVES OF AN OPTICAL-FIBER WITH A TREFOIL CROSS-SECTION UNDER THE WEAK GUIDANCE APPROXIMATION, Optik (Stuttgart), 109(4), 1998, pp. 163-166

Authors: KAMAL H ALDA J BERNABEU E
Citation: H. Kamal et al., THE DIFFRACTION INTEGRAL FOR THICK LENS OPTICAL ARRAYS, Optik (Stuttgart), 109(4), 1998, pp. 167-172

Authors: GEORGIEVA EM LALOV IJ GOSPODINOV M
Citation: Em. Georgieva et al., THE MUELLER REFLECTION MATRIX OF ISOTROPIC CHIRAL SPECIMEN, Optik (Stuttgart), 109(4), 1998, pp. 173-176

Authors: XIAO MF MACHORRO R
Citation: Mf. Xiao et R. Machorro, SUBWAVELENGTH RESOLUTION IN FAR-FIELD MICROSCOPY WITHOUT NEAR-FIELD PROBE, Optik (Stuttgart), 109(4), 1998, pp. 177-180

Authors: ZUZAN H HOLBROOK JA KIM PT HARAUZ G
Citation: H. Zuzan et al., SELF-ORGANIZATION OF CRYOELECTRON MICROGRAPHS OF THE PHOSPHOENOLPYRUVATE SYNTHASE FROM STAPHYLOTHERMUS-MARINUS, Optik (Stuttgart), 109(4), 1998, pp. 181-189

Authors: AIELLO D BORGHI R SANTARSIERO M VICALVI S
Citation: D. Aiello et al., THE INTEGRATED INTENSITY OF FOCUSED FLATTENED GAUSSIAN BEAMS, Optik (Stuttgart), 109(3), 1998, pp. 97-103

Authors: KE PC GU M
Citation: Pc. Ke et M. Gu, EFFECT OF THE SAMPLE CONDITION ON THE ENHANCED EVANESCENT-WAVE USED FOR LASER-TRAPPING NEAR-FIELD MICROSCOPY, Optik (Stuttgart), 109(3), 1998, pp. 104-108

Authors: HENAO R POMARICO J TORROBA R
Citation: R. Henao et al., DIGITAL SPECKLE PATTERN INTERFEROMETRY APPLIED TO SMALL ROTATION MEASUREMENTS, Optik (Stuttgart), 109(3), 1998, pp. 109-112

Authors: JING HM LIU L SHAO L LI GQ
Citation: Hm. Jing et al., OPTICAL FUZZY IMAGE-PROCESSING BASED ON SPATIAL NONLINEAR ENCODING SCHEME AND MULTIPLE-IMAGING TECHNIQUE, Optik (Stuttgart), 109(3), 1998, pp. 113-118

Authors: ZHANG H WANG ZQ CARTWRIGHT CM DING MS COOK NJ GILLESPIE WA
Citation: H. Zhang et al., A CIRCULAR HARMONIC QUANTIZED AMPLITUDE COMPENSATED MATCHED-FILTER, Optik (Stuttgart), 109(3), 1998, pp. 119-123

Authors: LEHMAN M TORROBA R GARAVAGLIA M
Citation: M. Lehman et al., MULTIPLE NON-SPECULAR SHIFTS IN THE REFLECTION OF SUPER-GAUSSIAN BEAMS FROM A THIN-FILM, Optik (Stuttgart), 109(3), 1998, pp. 124-132

Authors: LIN CS PU HC CHEN CH CHEN DC
Citation: Cs. Lin et al., USING DISCRIMINATE FUNCTION AND COUNTING MASK OPERATION FOR COUNTING SPACERS IN LIQUID-CRYSTALS DISPLAY PLATE, Optik (Stuttgart), 109(3), 1998, pp. 133-139

Authors: LAKHTAKIA A LAKHTAKIA NS
Citation: A. Lakhtakia et Ns. Lakhtakia, A PROCEDURE FOR EVALUATING DEPOLARIZATION DYADICS OF POLYHEDRA, Optik (Stuttgart), 109(3), 1998, pp. 140-142

Authors: REUBEN AJ
Citation: Aj. Reuben, THE ANALYTIC DETERMINATION OF ELECTROSTATIC POTENTIALS FOR SIMPLE MULTIELECTRODE LENSES, Optik, 109(2), 1998, pp. 49-60

Authors: FREIMANN R DORBAND B
Citation: R. Freimann et B. Dorband, ABERRATED POINT-SPREAD FUNCTION FOR GAUSS-SHAPED WAVE-FRONT ERRORS, Optik, 109(2), 1998, pp. 61-67

Authors: XIMEN J LIU ZX
Citation: J. Ximen et Zx. Liu, ANALYTICAL ANALYSIS AND NUMERICAL-CALCULATION OF FIRST-ORDER AND 3RD-ORDER CHROMATIC ABERRATIONS IN GLASER BELL-SHAPED MAGNETIC LENS, Optik, 109(2), 1998, pp. 68-76

Authors: CASTANEDA R MEDINA FF
Citation: R. Castaneda et Ff. Medina, ON SPATIAL COHERENCE BEAMS, Optik, 109(2), 1998, pp. 77-83

Authors: CHENG HQ LIU LR JING HM SHAO L
Citation: Hq. Cheng et al., THE MORPHOLOGICAL RANK ORDER GRAY-SCALE EROSION AND ITS OPTICAL IMPLEMENTATION, Optik, 109(2), 1998, pp. 84-88

Authors: YU QF LIU XL SUN XY LEI ZH
Citation: Qf. Yu et al., DOUBLE-IMAGE AND SINGLE-IMAGE PHASE-SHIFTING METHODS FOR PHASE MEASUREMENT, Optik, 109(2), 1998, pp. 89-95

Authors: SANTHANAKRISHNAN T SREEDHAR PR SIROHI RS
Citation: T. Santhanakrishnan et al., PASSIVE OPTICAL WAVE-GUIDE DEVICES BY ION-EXCHANGE IN GLASS, Optik, 109(1), 1998, pp. 1-4

Authors: TSAI FC CREWE AV
Citation: Fc. Tsai et Av. Crewe, A GAPLESS MAGNETIC OBJECTIVE LENS FOR LOW-VOLTAGE SEM, Optik, 109(1), 1998, pp. 5-11

Authors: LI ZY GU BY YANG GZ
Citation: Zy. Li et al., SELF-CONSISTENT GLOBAL-MODEL FOR THE NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Optik, 109(1), 1998, pp. 12-14
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