Citation: Bm. Ayupov, DETERMINATION OF OPTICAL-PROPERTIES VARIATION OF SILICON AND GLASS SURFACES AFTER MECHANICAL AND PLASMA TREATMENTS BY MONOCHROMATIC ELLIPSOMETRY, Optik (Stuttgart), 109(4), 1998, pp. 145-149
Citation: Uk. Singh et al., MODAL-ANALYSIS OF ANNULAR OPTICAL WAVE-GUIDES BOUNDED BY NONCOAXIAL DIELECTRIC CYLINDRICAL BOUNDARIES BY GOELLS POINT MATCHING METHOD, Optik (Stuttgart), 109(4), 1998, pp. 150-154
Citation: A. Sharma et al., MODAL DISPERSION-CURVES OF AN OPTICAL-FIBER WITH A TREFOIL CROSS-SECTION UNDER THE WEAK GUIDANCE APPROXIMATION, Optik (Stuttgart), 109(4), 1998, pp. 163-166
Citation: Mf. Xiao et R. Machorro, SUBWAVELENGTH RESOLUTION IN FAR-FIELD MICROSCOPY WITHOUT NEAR-FIELD PROBE, Optik (Stuttgart), 109(4), 1998, pp. 177-180
Citation: H. Zuzan et al., SELF-ORGANIZATION OF CRYOELECTRON MICROGRAPHS OF THE PHOSPHOENOLPYRUVATE SYNTHASE FROM STAPHYLOTHERMUS-MARINUS, Optik (Stuttgart), 109(4), 1998, pp. 181-189
Citation: Pc. Ke et M. Gu, EFFECT OF THE SAMPLE CONDITION ON THE ENHANCED EVANESCENT-WAVE USED FOR LASER-TRAPPING NEAR-FIELD MICROSCOPY, Optik (Stuttgart), 109(3), 1998, pp. 104-108
Citation: Hm. Jing et al., OPTICAL FUZZY IMAGE-PROCESSING BASED ON SPATIAL NONLINEAR ENCODING SCHEME AND MULTIPLE-IMAGING TECHNIQUE, Optik (Stuttgart), 109(3), 1998, pp. 113-118
Citation: M. Lehman et al., MULTIPLE NON-SPECULAR SHIFTS IN THE REFLECTION OF SUPER-GAUSSIAN BEAMS FROM A THIN-FILM, Optik (Stuttgart), 109(3), 1998, pp. 124-132
Citation: Cs. Lin et al., USING DISCRIMINATE FUNCTION AND COUNTING MASK OPERATION FOR COUNTING SPACERS IN LIQUID-CRYSTALS DISPLAY PLATE, Optik (Stuttgart), 109(3), 1998, pp. 133-139
Citation: J. Ximen et Zx. Liu, ANALYTICAL ANALYSIS AND NUMERICAL-CALCULATION OF FIRST-ORDER AND 3RD-ORDER CHROMATIC ABERRATIONS IN GLASER BELL-SHAPED MAGNETIC LENS, Optik, 109(2), 1998, pp. 68-76