MULTIPLE SOLUTION IN MAXIMUM-ENTROPY DECONVOLUTION OF HIGH-RESOLUTIONELECTRON-MICROSCOPE IMAGES

The origin of multiple solution in maximum entropy image deconvolution has been analyzed for simple crystal structures. It is illustrated th at the entropy-defocus curves contain two kinds of peaks. The sharp pe aks originate in the loss of at least one diffracted beam due to the d efined threshold for contrast transfer function. There are several smo oth peaks, and the deconvoluted images corresponding to these peaks ar e closely related to one another. It is illustrated how to select the correct solution from among all deconvoluted images.