MORPHOLOGY INVESTIGATION OF HG1-XCDXTE LIQUID-PHASE EPITAXIAL-FILMS

Authors
LI B CHU JH ZHU JQ CHEN XQ CAO JY TANG DY
Citation
B. Li et al., MORPHOLOGY INVESTIGATION OF HG1-XCDXTE LIQUID-PHASE EPITAXIAL-FILMS, Journal of crystal growth, 163(4), 1996, pp. 348-352
Citations number
17
Categorie Soggetti
Crystallography
Journal title
Journal of crystal growth → ACNP
ISSN journal
00220248
Volume
163
Issue
4
Year of publication
1996
Pages
348 - 352
Database
ISI
SICI code
0022-0248(1996)163:4<348:MIOHLE>2.0.ZU;2-D
Abstract
Scanning electron microscopy (SEM), energy dispersive analysis of X-ra y (EDAX) and optical microscopy were used to investigate Hg1-xCdxTe li quid phase epitaxial (LPE) films. The results show that a quality subs trate with critical misorientation and appreciable growth method can i mprove the surface morphology.