A SIMPLE DC-BASED METHOD FOR MONITORING TRANSISTOR CAPACITANCE

Authors
JOARDAR K
Citation
K. Joardar, A SIMPLE DC-BASED METHOD FOR MONITORING TRANSISTOR CAPACITANCE, Solid-state electronics, 39(8), 1996, pp. 1193-1198
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
Solid-state electronics → ACNP
ISSN journal
00381101
Volume
39
Issue
8
Year of publication
1996
Pages
1193 - 1198
Database
ISI
SICI code
0038-1101(1996)39:8<1193:ASDMFM>2.0.ZU;2-M
Abstract
A new methodology for measuring p/n junction capacitance is demonstrat ed. The method is d.c. based making it suitable for use in automated h igh volume measurements. The validity of the technique is supported by both simulated and experimentally measured data. Copyright (C) 1996 E lsevier Science Ltd