2-D SIMULATION OF KINK-RELATED SIDEGATING EFFECTS IN GAAS-MESFETS

Authors
Citation
K. Usami et K. Horio, 2-D SIMULATION OF KINK-RELATED SIDEGATING EFFECTS IN GAAS-MESFETS, Solid-state electronics, 39(12), 1996, pp. 1737-1745
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
39
Issue
12
Year of publication
1996
Pages
1737 - 1745
Database
ISI
SICI code
0038-1101(1996)39:12<1737:2SOKSE>2.0.ZU;2-I
Abstract
Sidegating (backgating) effects in a planar structure with sidegate on the same side as MESFET are studied by two-dimensional simulation and the results are compared with those for a structure with a backgate o n the back side of the substrate. The kink-related sidegating is repro duced in the planar structure, too. Its mechanism is discussed and is attributed to the change of EL2's role from an electron trap to a reco mbination center by capturing holes, which are generated by impact ion ization and how into the semi-insulating substrate including EL2 (deep donor). The dependence of shallow acceptor density in the semi-insula ting substrate is also studied. It is shown that the kink-related side gating is less remarkable in the case with lower acceptor density in t he substrate. Potential dependence of sidegating effects on the sidega te (backgate) position is also discussed. Copyright (C) 1996 Elsevier Science Ltd