A COMPARISON OF RHEED RECONSTRUCTION PHASES ON (100)INAS, GAAS AND INP

Citation
B. Junno et al., A COMPARISON OF RHEED RECONSTRUCTION PHASES ON (100)INAS, GAAS AND INP, Journal of crystal growth, 164(1-4), 1996, pp. 66-70
Citations number
9
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
164
Issue
1-4
Year of publication
1996
Pages
66 - 70
Database
ISI
SICI code
0022-0248(1996)164:1-4<66:ACORRP>2.0.ZU;2-Y
Abstract
We have begun to compile a list of the surface reconstructions for (00 1) InAs, GaAs and InP. The symmetries that we have observed include 1 x 1, 2 x 1, 2 x 4, 4 x 6, 3 x 4, 4 x 3, 2 x 3, 3 x 3, 1 x 3, 3 x 1, 3 x 2, 4 x 1 and 8 x 2, These reconstructions were observed during vario us growth and non-growth conditions in order to make up phase diagrams that depend on the group V and III fluxes and the temperature. Some o f the phase boundaries can serve as temperature reference points in ou r epitaxy machine. A comparison of the different semiconductor surface s is made and the growth properties of these surfaces are discussed.