A HE-4 CRYOSTAT FOR SYNCHROTRON SINGLE-CRYSTAL DIFFRACTION EXPERIMENTS IN THE TEMPERATURE-RANGE 1.6 TO 300 K

Citation
T. Bruckel et al., A HE-4 CRYOSTAT FOR SYNCHROTRON SINGLE-CRYSTAL DIFFRACTION EXPERIMENTS IN THE TEMPERATURE-RANGE 1.6 TO 300 K, Journal of applied crystallography, 29, 1996, pp. 686-691
Citations number
10
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
29
Year of publication
1996
Part
6
Pages
686 - 691
Database
ISI
SICI code
0021-8898(1996)29:<686:AHCFSS>2.0.ZU;2-N
Abstract
A commercial He-4 bath cryostat with variable temperature insert has b een adapted for single-crystal syn synchrotron diffraction experiments in the vertical diffraction plane. A special design of the X-ray wind ows makes the full -10 to 180 degrees 2 theta range accessible. A base temperature of 1.6 K can be achieved. The temperature stability in th e low-temperature region from 1.6 to 20 K amounts to +/- 1 mK. Two int ernal and virtually play-free sample movements have been developed. Wh en these are combined with the goniometers of the diffractometer, the following ranges for the Eulerian angles become accessible: -10 < omeg a < 100 degrees, 75 < chi < 105 degrees, -15 < phi < 15 degrees, -180 < psi < 180 degrees.