K. Hasnat et al., A PSEUDO-LUCKY ELECTRON MODEL FOR SIMULATION OF ELECTRON GATE CURRENTIN SUBMICRON NMOSFETS, I.E.E.E. transactions on electron devices, 43(8), 1996, pp. 1264-1273
An energy parameterized pseudo-lucky electron model for simulation of
gate current in submicron MOSFET's is presented in this paper, The mod
el uses hydrodynamic equations to describe more correctly the carrier
energy dependence of the gate injection phenomenon, The proposed model
is based on the exponential form of the conventional lucky electron g
ate current model, Unlike the conventional lucky electron model, which
is based on the local electric fields in the device, the proposed mod
el accounts for nonlocal effects resulting from the large variations i
n the electric field in submicron MOSFET's, This is achieved by formul
ating the lucky electron model in terms of an effective-electric field
, that is obtained by using the computed average carrier energy in the
device and the energy versus field relation obtained from uniform-fie
ld Monte Carlo simulations. Good agreement with gate currents over a w
ide range of bias conditions for three sets of devices is demonstrated
.