W. Taudt et al., NITROGEN DOPING OF ZNSE WITH TRIMETHYLSILYLAZIDE, TRIALLYLAMINE OR BISDITRIMETHYLSILYLAMIDOZINC DURING METALORGANIC VAPOR-PHASE EPITAXY, Journal of crystal growth, 169(2), 1996, pp. 243-249
Several nitrogen precursors without nitrogen hydrogen bonds were teste
d to dope ZnSe in a MOVPE process. Bisditrimethylsilylamidozinc (ZnBTM
), trimethylsilylazide (TMSiN) and triallylamine (TAN) were used to gr
ow ZnSe:N with ditertiarybutylselenide (DTBSe), diisopropylselenide (D
IPSe) and dimethylzinc-triethylamine (DMZn-TEN) at growth temperatures
between 340 and 420 degrees C. The samples were analysed by photolumi
nescence (PL), current-voltage (I-V), capacitance-voltage (C-V) and Ha
ll measurements, The dependence of nitrogen incorporation and electric
al activation on growth temperature, VI/II ratio and dopant flow were
investigated. In the PL spectra of the layers grown with TMSiN an inte
nse bound-exciton emission, correlated to Zn vacancies is observed, be
sides the I-1(N) emission line for high dopant flows. The samples grow
n with ZnBTM and TAN as precursors exhibit a broadening of the exciton
ic emissions and a shift towards the energetic position of the I-1(N)
emission line for increasing nitrogen incorporation in the layers. The
intensity of the excitonic emissions in comparison to the donor-accep
tor pair emissions remains dominating. Although Hall measurements of s
everal samples doped with ZnBTM and TAN indicate p-type conductivity,
the analysis of the C-V and I-V measurements shows the n-type or semi-
insulating character of the samples.