Based on measurements of the Hall effect and thermally stimulated curr
ents, the energy levels of electroactive centers in p-CdGeP2 crystals
were found to be E(A1) = E(v) + (0.12 +/- 0.02) eV and E(A1) = E(v) (0.20 +/- 0.02) eV for low-resistivity samples and E(A) = E(v) + (0.65
+/- 0.02) eV for high-resistivity samples. The energy levels of noneq
uilibrium carrier traps were found to be E(t) = E(v) + (0.07 +/- 0.02)
eV for low-resistivity samples and E(t1) = E(v) + (0.21 + 0.02) eV an
d E(t2) = E(v) + (0.37 + 0.02) eV for high-resistivity samples.