NOVEL DRY-ETCHING TECHNIQUE USING VUV LIGHT-INDUCED SURFACE-REACTIONS

Citation
Y. Sugita et al., NOVEL DRY-ETCHING TECHNIQUE USING VUV LIGHT-INDUCED SURFACE-REACTIONS, Optoelectronics, 11(1), 1996, pp. 113-126
Citations number
28
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
ISSN journal
09125434
Volume
11
Issue
1
Year of publication
1996
Pages
113 - 126
Database
ISI
SICI code
0912-5434(1996)11:1<113:NDTUVL>2.0.ZU;2-R
Abstract
We have examined new etching methods using vacuum ultraviolet (VUV) li ght for application to fabrication of semiconductor devices. We have s uccessfully carried out highly selective and highly anisotropic etchin g of silicon dioxide using anhydrous HF as an etching gas. We also obt ained fine 0.1 mu m Si patterns using photo-ionized CF3 + ion etching. We carried out the low-temperature removal of native-oxide on Si(100) for very low-temperature homoepitaxy. We have explained the character istics of VUV light-induced surface reactions on semiconductor materia l.