M. Inayoshi et al., FORMATION OF POLYTETRAFLUOROETHYLENE THIN-FILMS BY USING CO2-LASER EVAPORATION AND XECL LASER-ABLATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(4), 1996, pp. 1981-1985
Citations number
10
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Laser evaporation and laser ablation methods were applied to the prepa
ration of polytetrafluoroethylene (PTFE) thin films. In the case of th
e laser evaporation method, PTFE targets were evaporated by a continuo
us wave (cw) CO2 laser (10.6 mu m), and fluorocarbon thin films were f
ormed at a deposition rate of as high as 2 mu m/min for a laser power
of 10 W. The chemical composition and structure of the deposited film
corresponded to those of a PTFE target, which was confirmed by x-ray p
hotoelectron spectroscopy and Fourier transform infrared absorption sp
ectroscopy analyses. In the laser ablation method, PTFE targets were a
blated by a XeCl excimer laser (308 nm). It is found that the deposite
d films contained a small amount of fluorine atoms on the surface. Fro
m these experiments, the successful formation of PTFE thin films was d
emonstrated for the first time using cw CO2 laser evaporation method.
(C) 1996 American Vacuum Society.