CONDUCTANCE AND LEAKAGE IN SUPERCONDUCTING TUNNEL-JUNCTIONS

Authors
GOODCHILD MS BARBER ZH BLAMIRE MG
Citation
Ms. Goodchild et al., CONDUCTANCE AND LEAKAGE IN SUPERCONDUCTING TUNNEL-JUNCTIONS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(4), 1996, pp. 2427-2432
Citations number
38
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
14
Issue
4
Year of publication
1996
Pages
2427 - 2432
Database
ISI
SICI code
0734-2101(1996)14:4<2427:CALIST>2.0.ZU;2-6
Abstract
We report an analysis of data from Nb/AlOx/Nb tunnel junctions. We sho w that both conductance and subgap leakage follow simple scaling laws as a function of oxidation conditions. The leakage effects are discuss ed in terms of a simple physical model of tunnel barrier inhomogeneity that is also applicable to directly deposited barriers on NbN. We dem onstrate that an improvement in barrier properties can be achieved by the use of a buffer layer overlying the barrier, and that this improve ment is consistent with a model based on resputtering effects. (C) 199 6 American Vacuum Society.