X-RAY MAGNETIC MICROSCOPY AND SPECTROSCOPY USING A 3RD-GENERATION SYNCHROTRON-RADIATION SOURCE

Citation
At. Young et al., X-RAY MAGNETIC MICROSCOPY AND SPECTROSCOPY USING A 3RD-GENERATION SYNCHROTRON-RADIATION SOURCE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3119-3125
Citations number
25
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
4
Year of publication
1996
Pages
3119 - 3125
Database
ISI
SICI code
1071-1023(1996)14:4<3119:XMMASU>2.0.ZU;2-Z
Abstract
Applications of x-ray magnetic circular dichroism (XMCD) to the study of magnetic materials are described. XMCD spectra can be used to quant itatively determine magnetic properties on an element-specific basis. These spectra are also sensitive to the chemical state and environment of the element being probed. The dichroism effect can also be used to produce images of microscopic magnetic structures and domains. Third generation synchrotron light sources are well suited to these experime nts. Current and planned facilities at the Advanced Light Source, the first of the new light sources in the U.S., are described, focusing on a new facility with specialized undulators which will directly produc e high flux, high brightness beams of circularly polarized x-rays. Wit h new beamlines which have been optimized for either spectroscopy or m icroscopy, this facility will provide the capability to provide detail ed information about magnetic materials. (C) 1996 American Vacuum Soci ety.