USING NIST CRYSTAL DATA WITHIN SIEMENS SOFTWARE FOR 4-CIRCLE AND SMART CCD DIFFRACTOMETERS

Authors
BYRAM SK CAMPANA CF FAIT J SPARKS RA
Citation
Sk. Byram et al., USING NIST CRYSTAL DATA WITHIN SIEMENS SOFTWARE FOR 4-CIRCLE AND SMART CCD DIFFRACTOMETERS, Journal of research of the National Institute of Standards and Technology, 101(3), 1996, pp. 295-300
Citations number
10
Categorie Soggetti
Engineering
Journal title
Journal of research of the National Institute of Standards and Technology → ACNP
ISSN journal
1044677X
Volume
101
Issue
3
Year of publication
1996
Pages
295 - 300
Database
ISI
SICI code
1044-677X(1996)101:3<295:UNCDWS>2.0.ZU;2-9
Abstract
NIST Crystal Data developed at The National Institute for Standards an d Technology has been incorporated with Siemens single crystal softwar e for data collection on four-circle and two-dimensional CCD diffracto meters. Why this database is useful in the process of single crystal s tructure determination, and how the database is searched, are describe d. Ideas for future access to this and other databases are presented.