Pb1-xSnxTe epitaxial layers singly doped with cadmium or indium and co
doped with both impurities were grown by the hot-wall method from a si
ngle vapor source. By varying deposition conditions and dopant content
, it is possible to obtain both p-type and n-type epilayers with stabl
e electrical properties and a carrier concentration of similar to 10(1
6) cm(-3).