HOT-HOLE INDUCED NEGATIVE OXIDE CHARGES IN N-MOSFETS - REPLY

Authors
WEBER W BROX M THEWES R SAKS NS
Citation
W. Weber et al., HOT-HOLE INDUCED NEGATIVE OXIDE CHARGES IN N-MOSFETS - REPLY, I.E.E.E. transactions on electron devices, 43(9), 1996, pp. 1474-1477
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
I.E.E.E. transactions on electron devices → ACNP
ISSN journal
00189383
Volume
43
Issue
9
Year of publication
1996
Pages
1474 - 1477
Database
ISI
SICI code
0018-9383(1996)43:9<1474:HINOCI>2.0.ZU;2-1