The kinetics and mechanisms of processes involved in the thermal oxida
tion of InP/Bi2S3 structures in oxygen were investigated. Surface oxid
ation involves the following sequence of phase changes: bismuth sulfid
e --> sulfate --> oxysulfate --> oxide. Simultaneously, reactions at t
he substrate/film interface yield a dense In2S3 layer, which notably h
inders diffusion of phosphorus to the surface, thus preventing its oxi
dation. With increasing oxidation temperature and/or time, the indium
content of the film rises. Reaction of indium with bismuth oxysulfate
yields In2O3. This step, controlled by indium diffusion, provides a ma
jor contribution to film growth.