THERMAL-OXIDATION OF INP BI2S3 STRUCTURES IN OXYGEN/

Citation
Iy. Mittova et al., THERMAL-OXIDATION OF INP BI2S3 STRUCTURES IN OXYGEN/, Inorganic materials, 32(9), 1996, pp. 917-919
Citations number
5
Categorie Soggetti
Material Science
Journal title
ISSN journal
00201685
Volume
32
Issue
9
Year of publication
1996
Pages
917 - 919
Database
ISI
SICI code
0020-1685(1996)32:9<917:TOIBSI>2.0.ZU;2-U
Abstract
The kinetics and mechanisms of processes involved in the thermal oxida tion of InP/Bi2S3 structures in oxygen were investigated. Surface oxid ation involves the following sequence of phase changes: bismuth sulfid e --> sulfate --> oxysulfate --> oxide. Simultaneously, reactions at t he substrate/film interface yield a dense In2S3 layer, which notably h inders diffusion of phosphorus to the surface, thus preventing its oxi dation. With increasing oxidation temperature and/or time, the indium content of the film rises. Reaction of indium with bismuth oxysulfate yields In2O3. This step, controlled by indium diffusion, provides a ma jor contribution to film growth.