M. Peckerar et al., FEATURE CONTRAST IN DOSE-EQUALIZATION SCHEMES USED FOR ELECTRON-BEAM PROXIMITY CONTROL, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3880-3886
Dose equalization by the GHOST technique fails to provide homogeneous
contrast when the two-Gaussian model does not adequately portray the b
eam-energy dose distribution. This leads to an undesirable pattern dep
endence to the contrast obtained. The degree to which this breakdown o
ccurs is shown in computer simulation. The most severe breakdown occur
s in enclosed (annular) structures where the effect of ''higher order'
' Gaussian deposition peaks are concentrated. Unanticipated background
fluctuations of about 10% of the nominal exposure dose are obtained.
As a result of this study, test structures are proposed which can exte
nd the utility of dose equalization.