M. Rothschild et al., HOW PRACTICAL IS 193 NM LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 4157-4161
The use of 193 nm ArF lasers to extend optical projection lithography
to its Limits was proposed as early as the mid 1980s. Since then stead
y progress has been made in this area, and the last two years in parti
cular have witnessed an exponentially growing interest in and commitme
nt to its development. At present, 193 nm lithography is a leading can
didate for printing 0.18 and 0.13 mu m devices. This article reviews t
he state of development of this technology at Lincoln Laboratory. Sign
ificant progress has been made in most areas: qualification of optical
materials, characterization of a prototype large-field projection sys
tem, development of photoresist processes, and the fabrication of comp
lementary metal-oxide semiconductor devices. (C) 1996 American Vacuum
Society.