Mjm. Vugts et al., ION-ASSISTED SI XEF2 ETCHING - TEMPERATURE-DEPENDENCE IN THE RANGE 100-1000 K/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(5), 1996, pp. 2820-2826
Citations number
24
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The Ar+-ion enhanced Si(100)/XeF2 reaction is studied in a multiple be
am setup for silicon temperatures from 100 K up to 1000 K. The XeF2 fl
ux is 2.7 monolayers/s and the Ar+ flux 0.033 monolayers/s at an energ
y of 1000 eV. Both the XeF2 consumption and the SiFx production are me
asured by mass spectrometry. The enhancement of the etch rate peaks ar
ound 250 K as is observed in both the XeF2 and SiFx signals. The gradu
al decline above 250 K is attributed to a diminished surface fluorinat
ion and XeF2 precursor concentration. The dropoff below 250 K is presu
mably caused by sputtering of the XeF2 precursor, as is concluded from
the temperature dependence of the XeF+/XeF2+ signal ratio. Around 175
K this decrease is so strong that the ions seem to no longer enhance,
but rather reduce, the etch rate. Below 150 K the ions are driving th
e etch process. In this range the spontaneous process is blocked by Xe
F2 condensation, but the ion-assisted process continues due to sputter
ing or dissociation of the condensate. (C) 1996 American Vacuum Societ
y.