C. Schonenberger et N. Kramer, NANOLITHOGRAPHY ON HYDROGEN-TERMINATED SILICON BY SCANNING-PROBE MICROSCOPY, Microelectronic engineering, 32(1-4), 1996, pp. 203-217
Scanning-probe microscopes (SPM), i.e. the scanning-tunneling and forc
e microscopes, can be used to locally oxidize hydrogen-terminated sili
con and hydrogenated amorphous silicon. Because of its reliability and
potential for pattern transfer, this lithography process has found gr
eat attention and has become a prototype process for SPM nanolithograp
hy. The local oxidization can be performed in ambient or ultra-high va
cuum (UHV), and it is initiated by strong electric fields, electron im
pact, or by short-wavelength light. In this article, the progress of t
his subfield of nanolithography is reviewed. Emphasis will be on the p
rocess conducted in humid environments were a fairly solid understandi
ng is emerging. For completeness, important experiments performed in U
HV will be discussed briefly. Finally, recent applications of this pro
cess technique to the fabrication of electronic devices will be presen
ted.