QUANTUM WIRES AND DOTS FOR OPTICAL STUDIES

Citation
A. Forchel et al., QUANTUM WIRES AND DOTS FOR OPTICAL STUDIES, Microelectronic engineering, 32(1-4), 1996, pp. 317-330
Citations number
32
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
32
Issue
1-4
Year of publication
1996
Pages
317 - 330
Database
ISI
SICI code
0167-9317(1996)32:1-4<317:QWADFO>2.0.ZU;2-Q
Abstract
InGaAs/InP quantum wires with widths down to 10 nm and dots with diame ters down to 16 nm have been realized by electron beam lithography and wet chemical etching. Compared to previously investigated dry etching processes optically inactive sidewall layers can be avoided. The lumi nescence spectra of the quantum wires and dots show band edge shifts o f up to about 80 meV due to the lateral quantization. Under high optic al excitation several lateral states are populated. The lateral size d ependence of the transition energies can be modelled quite accurately based on the measured sizes of the nanostructures. From the increase o f the luminescence linewidths at low excitation in narrow quantum wire s the typical size fluctuations in our structures are estimated to be on the order of +/- 2 nm.